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94
Mots clés
Measurement
Alloy
7550Pp
Growth
Ion implantation
15N
Diffusion
Nuclear reaction analysis
Acoustic
Photoluminescence
ALD
Nanoparticles
Aluminium
Gold
Transparent conductive oxide TCO
Rutherford backscattering spectrometry RBS
17Opp
17Op
Nitridation
17O
Thin film
18O resonance
Adsorption
Gallium oxide
6855Jk
Silica
Periodic multilayer
3C-SiC
Oxidation
7550Ee
Capillary condensation
Magnetic anisotropy
Adsorption Isotherms
Silicon carbide
Passivation
Nickel
27Ald p&α
Alloys
Aluminum
2H
Epitaxial growth
Low energy electron diffraction LEED
7630Lh
Annealing
Nuclear resonance profiling NRP
13C
Zinc oxide
Multilayer
AFM
Epitaxy
Ion beam analysis
PIXE
Channeling
Pb centers
Defects
Isotopic Tracing
RBS
Raman spectroscopy
Metal-insulator transition
Nanostructures
Al2O3
AC susceptibility
Silicon Carbide
Silicon
Indium oxide
Oxygen deficiency
Pulsed laser deposition
Magnetization curves
Acoustic propreties of solid
Kossel diffraction
SiC
Topological insulators
Stable isotopic tracing
Hysteresis
Ferromagnetic resonance
27Aldp
NRP
Thin films
Charge exchange
EPR
GaMnAs
Auger electron spectroscopy AES
Atomic Layer Deposition ALD
18O
27Alda
Adsorbed layers
Magnetic semiconductors
ADSORPTION DESORPTION HYSTERESIS
Energy loss
XPS
Evaluation
8140Ef
Topological defects
XRD
Density functional theory
Sputtering
Interface defects
Ageing
X-ray diffraction
HfO2